Simultaneous in situ measurements of x-ray reflectivity and optical spectroscopy during organic semiconductor thin film growth
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چکیده
Simultaneous in situ real-time measurements of x-ray reflectivity and differential reflectance spectroscopy were conducted during deposition of perfluorinated copper-phthalocyanine thin films on SiO2 /Si. We found a continuous spectral change coinciding with structural changes from submonolayer coverage, to standing bilayer-phase and to -phase for thicker films. This combined measurement enables us to study the relationship between structural and optical properties of organic semiconductor thin films. © 2010 American Institute of Physics. doi:10.1063/1.3478450
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تاریخ انتشار 2010